Diode testing pdf bmcc

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This is a standard GTO free-wheel diode application in Voltage-Source inverters (VSIs) in which the diode is fitted with a snubber designed for the GTO . This condition adequately represents the commutation of FWDs in McMurray and Undeland/Marquardt circuits. 1.1.2 R-snubber for RCD-snubber-diode, inductive switching per Fig. 2b TUNNEL DIODE TEST CIRCUITS L 2 is used to offset the bridge if capacitances larger than 20 guf are to be measured (O. 27 uh will offset 20 u uf at the measuring frequency of 20 mc). Note: When the bias is adjusted so that the parallel resistance measured is much greater than 1 - 5Kohms, the Analysis of Diode Test Conducted From the noted value just check the forward-biased voltage drop. If it is in the range of 0.7 0.1 for silicon then the diode is healthy else not fit. For germanium, the drop range for it to be good diode is 0.3 0.05.; On reversing the diode, if it shows OL then the diode is good (healthy). A flow chart for a typical TO-can laser diode packaging and test production line is shown in Figure 5. Wafers enter at the upper left-hand side of the diagram and undergo various processing and test steps before ending up as finished products. Not shown in the production flow chart are life-test studies used during the development of new devices, The following algorithm describes the operation of a Model 2400-based diode production test system to perform the measure- ments described when the polarity of the diode is known prior to functional testing. 1. Operator indicates to PC that a diode production lot is in place and ready for test. 2. PC initiates 2400 operation over IEEE bus.